Solutions for efficient testing in hard economic times
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As the global economic climate places additional constraints on budgets, test engineers are challenged to identify ways to test devices more cost-efficiently than ever before, according to National Instruments (NI), a worldwide player in test and measurement.
NI has identified three trends – software-defined instrumentation, parallel processing technologies and new methods for wireless and semiconductor test – that will significantly improve the efficiency of test and measurement systems in 2009.
These trends help engineers develop faster and more flexible automated test systems while reducing their overall cost of test, and companies worldwide and from all industry segments can see significant benefits from applying these methods and technologies.
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Tuesday 13 January, 2009 12:24 AM |
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